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Avoiding reverse recovery effects in super junction MOSFET based half-bridges

机译:避免基于Super Junction MOSFET的反恢复效果的半桥

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For applications with a dc-link voltage in the range of 400 V and high switching frequencies, Super Junction MOSFETs are superior to standard MOSFETs due to their low on-state resistance. However, they suffer from an extensive reverse recovery effect of their intrinsic body diode. This limits their usage in hard-switching half-bridge configurations. This paper analyzes a modified half-bridge based on Super Junction MOSFETs, which offers significantly reduced reverse recovery losses while maintaining current conduction in reverse direction through the Super Junction MOSFET. Hence, the application of Super Junction MOSFETs in hard switched topologies becomes possible. Measurements of relevant voltage and current waveforms as well as the thermal distribution show the efficiency of the proposed method.
机译:对于具有400 V和高开关频率范围内的直流链路电压的应用,由于其低导通电阻,超级结MOSFET优于标准MOSFET。然而,它们遭受其内在体二极管的广泛反恢复效果。这限制了它们在硬切换半桥配置中的用法。本文分析了基于超级结MOSFET的改进的半桥,其在通过超结MOSFET保持反向保持电流导通的同时显着降低的反恢复损耗。因此,可以在硬开关拓扑中应用超结合MOSFET。相关电压和电流波形的测量以及热分布显示了所提出的方法的效率。

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