首页> 外文会议>61st Electronic Components Technology Conference, 2011 >Large-area low-cost substrate compatible CNT Schottky diode for THz detection
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Large-area low-cost substrate compatible CNT Schottky diode for THz detection

机译:大面积低成本衬底兼容的CNT肖特基二极管,用于THz检测

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In this paper, a novel process is developed for the fabrication of CNT Schottky diodes that is simple to implement and large area compatible. The process utilizes an undercut and self-alignment approach for the fabrication of devices having short lengths (< 1 um). Furthermore, many CNTs assembled in parallel are utilized in the fabrication of devices to attain good impedance matching. Details of THz detector NEP calculation, fabrication and test of diode devices after integration on a plastic substrate are presented. Measured I-V characteristics and sensitivity at 18 GHz demonstrate that high quality devices can be fabricated using the proposed approach. Preliminary results show that the device can attain NEP values in the range of 50–150pW/Hz05 over a frequency range of 10 GHz–1THz, respectively.
机译:在本文中,开发了一种新颖的用于制造CNT肖特基二极管的工艺,该工艺易于实现且具有大面积兼容性。该工艺利用底切和自对准方法来制造具有短长度(<1μm)的器件。此外,在装置的制造中利用许多并联组装的CNT来获得良好的阻抗匹配。介绍了集成在塑料基板上的THz检测器NEP的计算,二极管器件的制造和测试的详细信息。在18 GHz下测得的I-V特性和灵敏度表明,可以使用建议的方法制造高质量的器件。初步结果表明,该器件在10 GHz–1THz的频率范围内分别可以达到50–150pW / Hz 05 范围内的NEP值。

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