X-ray Integrated Digital Imaging System Based on a-si Flat Panel Detector

摘要

X-ray phase contrast imaging (X-PCI) is one of the novel imaging methods. For the low density substance, it provides better images than the conventional X-ray attenuation imaging. In order to get a high-quality image, X-PCI adopts the high spatial resolution image intensifier as the detector. However, the X-ray attenuation imaging usually adopts the high sensitivity a-si flat panel detector (FPD) as the detector. So it is currently one of the questions in the field of X-ray imaging how to realize these two functions at a system: X-ray attenuation imaging and X-PCI. An X-ray integrated digital imaging system based on FPD is designed and developed after analyzing the imaging principle of X-PCI and the imaging feature of FPD. The results from simulation and experiments in this system show that the X-PCI image can be acquired without affecting the quality of the conventional X-ray attenuation image. It demonstrates the possibility to realize these two functions at a system.