Micro-Scale Linear Birefringence Measurement

摘要

A new method for linear birefringence measurement in micro-scale is presented. Mueller matrix is used to represent the anisotropy properties of sample, optical fiber probe of scanning optical near-field microscopy (SNOM) and other optical components. Two polarization modulators are used to complete the quantitative measurement. Firstly, the Mueller matrix of the probe is calculated by analyzing the output signal without sample. Together with the matrix of the probe, the elements of the Mueller matrix of sample could be calculated sequentially. The principle and realization method of the scheme for linear birefringence measurement are presented. The result shows that the dual-modulator-based system can separate the anisotropy of probe and sample, which could not be distinguished in the current scheme that using only one polarization modulator.