An Experimentally Based Characterization of Solar Cell Structure Defects by Means of Noise and Optical Activities Analysis

摘要

This paper will be discussed the issue of non-destructive testing of silicon solar cells structure. The fabricated devices generally exhibit lots of different imperfections that limit the ability to apply new composite materials and technological approaches. We demonstrate high sensitive electrical noise measurement philosophy with strictly non-destructive character in order to identify defects physical nature. Main parameters in the view are excess leakage current and electric noise, live-time and reliability reduction and finally decreasing of conversion efficiency. Here will be presented relations between the specimen transport characteristic and electric noise generated in consequence of the local electric breakdowns in the affected regions. In addition, we are able to show that fracture-based defects are attended by the low intensity light emission especially in visible and deep infrared wavelength range. Nevertheless, optical activity physical nature is in a question. For this reason we will present also measurement of optical spectra radiation and optical intensity vs. voltage bias and temperature to introduce different defect phenomena interpretation.