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Crystallite size determination of MgO nanopowder from X-ray diffraction patterns registered in GIXD technique

机译:根据GIXD技术中记录的X射线衍射图确定MgO纳米粉的微晶尺寸

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The problem of the crystallite size determination for nanomaterials from X-ray diffraction data obtained in asymmetrical GIXD geometry was analyzed. The studies were performed on nanocrystalline MgO powder prepared by sol-gel synthesis. The nanopowder was preliminary characterized from X-ray diffraction pattern registered in classical Bragg-Brentano geometry and electron microscope observation. The estimated crystallite size, calculated form Williamson-Hall method, equals to 5 nm whereas the lattice distortion is negligible (0.1%). The Xray diffraction patterns were registered in 30-135° 20 range using tunnel GIXD technique for the incident a angle: 0.25; 0.5; 1; 2.5 and 5 degrees, respectively. Additional broadening of diffraction lines originated from applied geometry was observed. The calculated crystallite size deviate significantly in comparison to results obtained from classical Bragg-Brentano data. Corrections for additional line broadening were determined, which should be applied for accurate crystallite size calculation in studies of thin nanocrystalline layers using GIXD technique.
机译:分析了从不对称GIXD几何结构中获得的X射线衍射数据确定纳米材料的微晶尺寸的问题。对通过溶胶-凝胶合成制备的纳米晶MgO粉末进​​行了研究。通过经典的Bragg-Brentano几何学中记录的X射线衍射图谱和电子显微镜观察对纳米粉末进行了初步表征。通过Williamson-Hall方法计算得出的估计微晶尺寸等于5 nm,而晶格畸变可以忽略不计(0.1%)。使用隧道GIXD技术将X射线衍射图记录在30-135°20范围内,入射角为0.25;入射角为0.25。 0.5; 1;分别为2.5度和5度。观察到源自应用的几何形状的衍射线的进一步加宽。与从经典的Bragg-Brentano数据获得的结果相比,计算出的微晶尺寸显着偏离。确定了用于附加线展宽的校正,该校正应用于使用GIXD技术研究纳米薄晶层时进行精确的晶粒尺寸计算。

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