Analysis of rectangular microstrip structures by the method of moments

摘要

Rectangular microstrip structures (RMS) are widely used in various microwave devices. Using the method of moments and principle of partial images, various techniques are created to determine charge distribution in 2D models of microstrip structures (their cross-section). In this paper, a technique for calculating surface charge distribution and total capacitance of complex 3D rectangular microstrip structures is proposed using the mentioned method and principle. To demonstrate feasibility of the proposed technique, three RMS were investigated. Obtained results are compared with the data published by other researches. Total error is typically less than 5%.