Nanoelectronic systems are now more and more prone to faults and defects, permanent or transient. Redundancy techniques are implemented widely to increase the reliability, especially the TMR — Triple Modular Redundancy. However, many researchers assume that the voter is perfect and this may not be true. This paper proposes a simple but effective fault-tolerant voter circuit which is more reliable and less expensive. Experimental results demonstrate its improvement over the former TMR structures.
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