首页> 外文会议>2nd IEEE Energy Conversion Congress and Exposition >Estimation of internal junction temperature thermal resistance of light-emitting diodes using external luminous flux measurements
【24h】

Estimation of internal junction temperature thermal resistance of light-emitting diodes using external luminous flux measurements

机译:使用外部光通量测量来估算发光二极管的内部结温和热阻

获取原文

摘要

Although critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. From the general photo-electro-thermal theory for LED systems, new equations for estimating the internal junction temperature Tj and junction-case thermal resistance Rjc of LED from the luminous flux measurements, which can be obtained relatively easily, are presented and verified practically. These equations provide a valuable tool for checking Tj in LED system design without expensive equipment.
机译:尽管对于LED的寿命至关重要,但无法轻松测量LED的结温。从LED系统的一般光电热理论出发,从发光量估算LED的内部结温T j 和结壳热阻R jc 的新方程式可以相对容易地获得的磁通量测量值已经提出并得到了实际验证。这些方程式为在不使用昂贵设备的情况下检查LED系统设计中的T j 提供了有价值的工具。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号