首页> 外文会议>International symposium on advanced optical manufacturing and testing technologies;AOMATT08 >Compositional dependence of absorption edges in evaporated Pb_(1-x)GeTe thin films as infrared short-wavelength cutoff filters
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Compositional dependence of absorption edges in evaporated Pb_(1-x)GeTe thin films as infrared short-wavelength cutoff filters

机译:蒸发的Pb_(1-x)GeTe薄膜作为红外短波截止滤光片的吸收边缘的成分依赖性

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Semiconductors which exhibit a very rapid transition from opacity to transparency at the intrinsic edge are particularly useful in making excellent absorption filters. In this paper, we report the investigation on composition dependence of absorption edges in the evaporated Pb_(1-x)Ge_xTe thin films, which will be of a potentiality to fabricate a single-layer infrared short-wavelength cutoff filter by means of controlling the composition and processes. It is revealed that for thin films with an identical Te concentration, the absorption edges will shift towards short-wavelength with the increase of Ge concentration x in films; whereas, for those with a similar Ge concentration within a small range of deviation, the edges will also shift towards the short-wavelength with Te concentration approach to stoichiometry.
机译:在本征边缘处显示出从不透明性到透明性非常快的过渡的半导体在制造出色的吸收滤光片时特别有用。在本文中,我们报告了对蒸发的Pb_(1-x)Ge_xTe薄膜中吸收边缘的成分依赖性的研究,这将有可能通过控制光致发光来制造单层红外短波截止滤光片。组成和过程。结果表明,对于具有相同Te浓度的薄膜,随着薄膜中Ge浓度x的增加,吸收边会向短波方向移动;随着Ge浓度的增加,吸收边向短波方向移动。相反,对于那些在较小偏差范围内具有相似Ge浓度的化合物,其边缘也将通过Te浓度化学计量法向短波长移动。

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