Secondary electron emission on degradation sample and development of new measurement system with low electron energy

摘要

We studied measurement of secondary electron emission (SEE) of metal and insulating materials used for satellite thermal insulation or other such purposes. The SEE yield measurement is very important for analyzing charge accumulation on satellite surfaces for a space environment because electron emission related to irradiated electrons influences the amount of surface charge. Therefore, we tried to measure the SEE yield. Furthermore, we must consider degradation phenomena of surface materials for spacecraft caused by radioactive rays. According to the degradation of materials, those SEE yields might change compared to a non- degradation sample. Therefore, we tried to measure the SEE yields of surface materials for spacecraft which are treated using the degradation process. For preparing a degradation sample, those samples were irradiated by an electron beam and UV to simulate degradation in a space environment. We take three irradiation conditions for electron beam and UV irradiation that related with GEO orbit and operating period. This report introduce a few results of the SEE yield of the satellite materials applied degradation process simulated space environment and discuss the relationship between the SEE yields and sample degradation when irradiated by an e-beam and UV. Furthermore, we also introduce the new SEE measurement system which can irradiated electron with an energy under 0.6 keV