Optimal Design of Accelerated Failure Test Under Multiple Stresses With An Application to S-N Curve Estimation

摘要

There is much research on optimal reliability test plans, however most research only focuses on reliability test under single stress. This paper derives the optimal reliability test plan for drawing the S-N curves under multiple stresses. Assuming that the product lifetime distribution follows a Weibull distribution, we consider a model where the scale parameter is dependent on loaded stress and environmental stress. Based on this model, we derived the conditions required to carry out an optimal reliability test. The conditions ere erived by examining the conditions that minimize the asymptotic variances of the MLE's (maximum likelihood estimators) of the unknown parameters.