This paper provides an overview of various thermal issues in high-performance VLSI with especial attention to their implications for performance and reliability. More specifically, it examines the impact of thermal effects on both interconnect design and electromigration reliability and discusses their impact on the allowable current density limits. Furthermore, it also discusses how thermal and reliability constrained current density limits may conflict with those obtained through purely performance based criterion. Additionally, it is shown that chip level thermal effects can have a significant impact on large-scale circuit optimization techniques, including the clock-skew minimization scheme, and can influence other physical design problem formulations. Finally, high-current interconnect design rules for ESD and I/O circuits are also examined.
机译:混合粒子群算法-和声搜索算法优化热感知VLSI非切片布局
机译:混合粒子群算法-和声搜索算法优化热感知VLSI非切片布局
机译:热分析和散热器设计优化了高性能模块的冷却
机译:高性能VLSI中的散热问题的分析和优化
机译:纳米VLSI系统的功率和热完整性分析和优化。
机译:超声波辅助提取布鲁斯爪哇种子中脂肪酸的工艺研究。高效液相色谱和带电气溶胶检测技术同时进行不同来源的分离和同时分析
机译:高性能vlsi热问题的分析与优化