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Re-examination of the Raman lineshapes of diamond films grown by hot-filament and microwave-plasma chemical vapor deposition

机译:重新检查通过热丝和微波等离子体化学气相沉积法生长的金刚石薄膜的拉曼线形

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Abstract: TiO$-2$/ sol-gel coatings, about 100 nm in thickness, were prepared by hydrolysis of Ti-alkoxides in alcoholic solutions and dip-coating. X-ray photoelectron spectra (XPS), thin film X-ray diffraction, dynamic microhardness (DH) and refractive indices of the coatings on silica glass substrates were measured after drying and heat treating at temperatures in the range from 100 to 900$DGR@C. The crystallization temperature of thin coatings was more than 100$DGR@C higher than that of the bulk gels. Ols spectra of XPS and the depth profile of the microhardness of the coatings show that structural changes in the depth direction in the coatings. The surface layer with high microhardness is considered to have an Anatase-like structure or to crystallize rapidly. The inner layer with relatively low microhardness contain a certain amount of water after heat treating at 500$DGR@C. Ols spectra of the inner layer near the surface of the substrate were different from those of the other parts of the coatings. Significant increase in the microhardness of the glass substrates was observed near the interface between the coating and the substrate was observed. This result suggests that stress in the surface layer of the substrate is induced by the coating. This result also shows good adhesion of the coatings on glass substrates. The structural changes of the coatings during drying and heat treating are also discussed.!10
机译:摘要:通过在醇溶液中水解钛醇盐并浸涂,制备了厚度约为100 nm的TiO $ -2 $ /溶胶-凝胶涂层。在100至900 $ DGR @的温度下干燥和热处理后,测量石英玻璃基板上涂层的X射线光电子能谱(XPS),薄膜X射线衍射,动态显微硬度(DH)和折射率。 C。薄涂层的结晶温度比本体凝胶的结晶温度高100 $ DGR @ C以上。 XPS的Ols光谱和涂层的显微硬度的深度曲线表明,涂层在深度方向上的结构变化。具有高显微硬度的表面层被认为具有锐钛矿状结构或快速结晶。显微硬度相对较低的内层在500 $ DGR @ C热处理后含有一定量的水。靠近基材表面的内层的Ols光谱与涂层其他部分的Ols光谱不同。在涂层和基底之间的界面附近观察到玻璃基底的显微硬度显着增加。该结果表明,涂​​层在基材的表层中引起了应力。该结果还显示了涂层在玻璃基材上的良好粘附性。还讨论了涂层在干燥和热处理过程中的结构变化。!10

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