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Using Register Lifetime Predictions to Protect Register Files against Soft Errors

机译:使用寄存器寿命预测来保护寄存器文件免受软错误的影响

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To increase the resistance of register files to soft errors, this paper presents the ParShield architecture. ParShield is based on two observations: (i) the data in a register is only useful for a small fraction of the register''s lifetime, and (ii) not all registers are equally vulnerable. ParShield selectively protects registers by generating, storing, and checking the ECCs of only the most vulnerable registers while they contain useful data. In addition, it stores a parity bit for all the registers, re-using the ECC circuitry for parity generation and checking. ParShield has no SDC AVF and a small average DUE AVF of 0.040 and 0.010 for the integer and floating-point register files, respectively. ParShield consumes on average only 81% and 78% of the power of a design with full ECC for the SPECint and SPECfp applications, respectively. Finally, ParShield has no performance impact and little area requirements.
机译:为了提高寄存器文件对软错误的抵抗力,本文提出了ParShield体系结构。 ParShield基于两个观察结果:(i)寄存器中的数据仅在寄存器生命周期的一小部分有用,并且(ii)并非所有寄存器都同样容易受到攻击。 ParShield通过仅生成,存储和检查仅包含最有用数据的最易受攻击的寄存器的ECC来选择性地保护寄存器。此外,它为所有寄存器存储一个奇偶校验位,重新使用ECC电路进行奇偶校验生成和检查。对于整数和浮点寄存器文件,ParShield没有SDC AVF,并且平均DUE AVF较小,分别为0.040和0.010。对于SPECint和SPECfp应用,ParShield分别平均仅消耗具有完全ECC的设计的功率的81%和78%。最后,ParShield不会对性能产生影响,并且对面积的要求很小。

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