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Non-Empirical Modeling of Fatigue in Lead-Free Solder Joints: Fatigue Failure Analysis and Estimation of Fracture Parameters

机译:无铅焊点疲劳的非经验模型:疲劳失效分析和断裂参数估计

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Predicting the fatigue life of solder interconnections is a challenge due to the complex nonlinear behavior of solder alloys and the load history. Long experience with Sn-Pb solder alloys together with empirical fatigue life models such as the Coffin-Manson rule have helped us identify reliable choices among package design alternatives. However, for the currently popular Pb-free choice of SnAgCu solder joints, designing accelerated thermal cycling tests and estimating the fatigue life are challenged by the significantly different creep behavior relative to Sn-Pb alloys. This study is divided into two parts: In the first part, a hybrid fatigue modeling approach inspired by nonlinear fracture mechanics is discussed. The hybrid fatigue model has been shown to predict the crack trajectory and fatigue life of a Sn-Pb solder interconnection subjected to both isothermal accelerated thermal and anisothermal power cycling conditions. In the second part, results of experimental characterization via fatigue testing of microelectronic packages with SnAgCu solder interconnections subjected to anisothermal power cycling conditions are described. Packages of different geometries were tested to study the effects of these variations on the estimation of fatigue life. The afore mentioned hybrid model relies on the estimation of two fracture parameters which are to be determined experimentally. In this study, a novel technique involving tracking crack fronts in solder interconnections as a function of number of fatigue cycles is proposed to estimate these fracture parameters that can be then used to model fatigue crack growth using the hybrid modeling technique.
机译:由于焊料合金的复杂非线性行为和载荷历史,预测焊料互连的疲劳寿命是一个挑战。 Sn-Pb焊料合金的长期经验以及经验疲劳寿命模型(例如Coffin-Manson规则)已帮助我们确定了封装设计替代方案中的可靠选择。然而,对于当前流行的SnAgCu焊点的无铅选择,相对于Sn-Pb合金而言,蠕变行为显着不同,因此设计加速的热循环测试和估算疲劳寿命受到了挑战。这项研究分为两个部分:第一部分,讨论了受非线性断裂力学启发的混合疲劳建模方法。混合疲劳模型已经显示出可以预测在等温加速热和等温功率循环条件下,Sn-Pb焊料互连的裂纹轨迹和疲劳寿命。在第二部分中,描述了通过在等温功率循环条件下对具有SnAgCu焊料互连的微电子封装进行疲劳测试而得出的实验表征结果。测试了不同几何形状的包装,以研究这些变化对疲劳寿命估计的影响。前述的混合模型依赖于两个断裂参数的估计,这两个断裂参数将通过实验确定。在这项研究中,提出了一种新技术,该技术涉及跟踪焊料互连中的裂纹前沿与疲劳循环数的函数关系,以估计这些断裂参数,然后可以使用混合建模技术对这些断裂参数进行建模。

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