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ULTRATHIN FILMS OF GRAPHENE OXIDE - EVALUATION OF PHOTOREDUCTION PROCESSES

机译:氧化石墨烯超薄膜-光催化工艺评价。

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Approaches to graphene-based electronic materials and devices frequently use graphene oxide (GO), combined with a suitable reduction process to remove the oxygen-containing groups. Photoreduction of GO films can generate suitable structures of reduced graphene oxide (RGO) by means of irradiation masks or laser direct writing techniques. However, the photoreduction mechanisms are not fully resolved yet as the distinction between photothermal and photochemical reaction pathways still needs fundamental clarification. We have prepared ultrathin films of GO by single and multiple spin-coating from aqueous solutions, irradiated them with monochromatic light obtained from a high-pressure mercury arc combined with narrow band filters, and a femtosecond laser system at 800 nm. We used UV-Vis-NIR absorption spectroscopy to characterize the conversion and reaction rate of the photoreduction quantitatively. The reduction yield is evaluated by means of the ratio R = A_(400)/A_(217) where A_(400) and A_(217) refer to the absorbances at 400 nm after irradiation and at 217 nm afore, respectively. The impact of the light intensity I on the reaction yield R indicates the kind of photoreaction. Photothermal reactions show a threshold behavior, i.e., a minimum sample heating is required. Photochemical reactions can occur via single-photon absorption indicated by R ~ I which is independent on the magnitude of I, or via two-photon-absorption which is proven by the R ~ I~2 relationship. We verify pure photochemical photoreduction of GO by single-photon-absorption at wavelengths even up to 546 nm irradiation wavelengths, and two-photon induced photoreduction with high-intensity laser pulses at 800 nm.
机译:基于石墨烯的电子材料和器件的方法经常使用氧化石墨烯(GO),并结合适当的还原工艺以去除含氧基团。 GO膜的光还原可通过辐照掩模或激光直接写入技术生成合适的还原型氧化石墨烯(RGO)结构。但是,光还原机理尚未完全解决,因为光热和光化学反应途径之间的区别仍需要基本阐明。我们已经通过从水溶液中进行一次或多次旋涂制备了GO的超薄膜,用高压汞弧结合窄带​​滤光片获得的单色光和800 nm的飞秒激光系统对其进行了辐照。我们使用UV-Vis-NIR吸收光谱来定量表征光还原的转化率和反应速率。通过比率R = A_(400)/ A_(217)来评估还原产率,其中A_(400)和A_(217)分别是指照射后在400nm和之前在217nm的吸光度。光强度I对反应产率R的影响表明了光反应的种类。光热反应显示出阈值行为,即需要最小的样品加热。光化学反应可以通过R〜I表示的单光子吸收而发生,该光子吸收与I的大小无关,也可以通过R〜I〜2的关系证明双光子吸收。我们通过甚至在高达546 nm的照射波长处的单光子吸收,以及在800 nm处的高强度激光脉冲引起的两光子诱导的光还原,验证了GO的纯光化学光还原。

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