Sensitivity control to surface irregularity

摘要

In this paper it was shown that the sensitivity control to surface irregularity is possible and effective. The method is general and applicable to wide area of optical systems. The basic idea is to express the surface error as a sum of basic functions and to control the sensitivity to each base function as a target of the optimization. No additional raytrace is necessary for the calculation of the sensitivity and the CPU time for the optimization does not increase even with the sensitivity control. In order that the sensitivity control is practically effective, it is important to choose the practical base functions. The statistical method to determine the base functions was proposed. The importance of the aspherics in the optical instruments is more and more increasing and the general method to design the insensitive aspherics is very important.