首页> 外文会议>International Conference on Textures of Materials(ICOTOM 14) pt.1; 20050711-15; Leuven(BE) >The influence of errors of x-ray texture measurements on ODF calculation with central normal distribution approximation
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The influence of errors of x-ray texture measurements on ODF calculation with central normal distribution approximation

机译:X射线纹理测量的误差对以中心正态分布近似的ODF计算的影响

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摘要

Experimental pole figures are measured by x-ray method for materials with hexagonal symmetry (Ti and Mg alloys). The Orientation Distribution Function is calculated by approximation method with central normal distribution. Texture inhomogeneities and effects of defocusing are the main sources of pole density errors. The measurement errors depend on crystal direction {hkl} and are different for maximum and minimum regions on pole figure. The influence of texture measurement errors on accuracy of the ODF calculation is investigated.
机译:对于具有六边形对称性的材料(Ti和Mg合金),通过X射线方法测量了实验极图。方向分布函数是使用中心正态分布的近似方法计算的。纹理不均匀性和散焦的影响是极密度误差的主要来源。测量误差取决于晶体方向{hkl},并且对于极图上的最大和最小区域而言,测量误差是不同的。研究了纹理测量误差对ODF计算精度的影响。

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