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Equation of p-n Junction for High Current Density Models of Transistor

机译:晶体管高电流密度模型的p-n结方程

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摘要

The results of theoretical and experimental investigations of p-n junction at junction voltages close to the potential barrier are presented. It is shown that in such a situation the voltage-current characteristic can be described by algebraic equation in explicit form and that exponential description of characteristic is in conflict with physics at junction voltages close to the potential barrier. Possibility to create the transistor models for high current density and possibility to describe on basis of these models in many cases the static parameters of integrated circuits by mathematical expressions in explicit form is the advantage of suggested p-n junction equation.
机译:给出了在接近势垒的结电压下p-n结的理论和实验研究结果。结果表明,在这种情况下,可以通过代数方程以显式形式描述电压-电流特性,并且在接近势垒的结电压下,特性的指数描述与物理学相冲突。可能创建高电流密度的晶体管模型,并在许多情况下基于显式形式的数学表达式描述集成电路的静态参数的可能性是建议的p-n结方程的优势。

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