首页> 外文会议>International Conference on Diffusion in Solids: Past, Present and Future; 20050523-27; Moscow(RU) >Surface Spreading and Penetration of Liquid and Solid Ga in Thin Polycrystalline Ag Films
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Surface Spreading and Penetration of Liquid and Solid Ga in Thin Polycrystalline Ag Films

机译:液态和固态镓在多晶银薄膜中的表面扩散和渗透

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Spreading of liquid and solid Ga over the surface of thin polycrystalline Ag film is accompanied by fast penetration of Ga through the film. The penetration process between +60℃ and -10℃ has likely a common mechanism with the spreading. The activation energies of the process responsible for spreading/penetration are E_L = 0.310.05 eV and E_S = 0.5 ± 0.1 eV for liquid and solid Ga, respectively. The common mechanism is attributed to grain boundary (GB) grooving with diffusion of Ag out of the groove either via liquid Ga or along GBs in solid Ga. A possible formation of intermetallic compound between Ag and Ga is considered as the secondary process, which does not control the kinetics. The model reproduces the spreading/penetration rates that are observed, and gives reasonable estimates of the experimental activation energies E_S and E_L.
机译:液态和固态Ga扩散到多晶Ag薄膜的表面,伴随着Ga快速穿过薄膜。 + 60℃和-10℃之间的穿透过程可能与扩散有关。对于液体和固体Ga,负责扩散/渗透的过程的活化能分别为E_L = 0.310.05 eV和E_S = 0.5±0.1 eV。常见的机理归因于晶粒边界(GB)的开槽,其中Ag通过液体Ga或沿固体中的GBs扩散出沟槽而从槽中扩散出Ag。在Ag和Ga之间可能形成金属间化合物被认为是次要过程。无法控制动力学。该模型再现了观察到的扩散/渗透率,并给出了实验活化能E_S和E_L的合理估计。

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