Simulation of Electrical and Optical Interconnections for Future VLSI ICs

摘要

At present, metallic interconnections become the "bottleneck" of the further progress in VLSI technology. The optical solution is considered as an alternative that could allow overcoming the limitations but its advantage should be confirmed at the level of modeling approach. The clock distribution network (CDN) that is the most representative component of the modern VLSI circuits has been used as the test circuit and its numerical models for H-tree architecture have been worked out and used. The model of the electrical CDN as well as some results of simulations presenting its expected features, also with the comparison to the results obtained for its optical counterpart are presented.