首页> 外文会议>2018 International Conference on Advances in Computing, Communication Control and Networking >New improved Design for Low Leakage and high performance SRAM cell in ULP Applications
【24h】

New improved Design for Low Leakage and high performance SRAM cell in ULP Applications

机译:ULP应用中针对低泄漏和高性能SRAM单元的全新改进设计

获取原文
获取原文并翻译 | 示例

摘要

In present day electronic industry, the device size is day by day shrinking and memory is an integral part of present day battery operated and hand held electronic gadgets. So with the reduction in device size, memory is also scaled down and this increases the demand for low power devices. The utmost requirement is long battery for the devices capable of performing complex functions. Most of the devices use SRAM for cache memory and require low leakage in standby mode. This paper presents 6T SRAM designed using two fingers which shows reduction in leakage power. The simulations and layout are done on Cadence tool using UMC 55nm technology. It is shown that leakage current and delay can be improved by this technique.
机译:在当今的电子工业中,设备的尺寸在不断缩小,而内存已成为当今电池供电和手持式电子设备不可或缺的一部分。因此,随着设备尺寸的减小,存储器也按比例缩小,这增加了对低功耗设备的需求。对于能够执行复杂功能的设备,最大的要求是电池较长。大多数设备将SRAM用于高速缓存,并且在待机模式下要求低泄漏。本文介绍了使用两个手指设计的6T SRAM,它可以降低泄漏功率。仿真和布局是使用UMC 55nm技术在Cadence工具上完成的。结果表明,通过这种技术可以改善漏电流和延迟。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号