Combining SEM-EDS, PIXE and XRF Techniques for Complex Analytical Problems: Depth Profile Characterization of Prehispanic Gold

机译：结合SEM-EDS，PIXE和XRF技术解决复杂的分析问题：西班牙前金的深度剖面表征

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来源
《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》|2011年|1776-1777|共2页
会议地点 Nashville, TN(US)
作者
A. Perea; P. Fernández-Esquivel; S. Rovira-Llorens; J.L. Ruvalcaba-Sil; A. Verde; O. García-Vuelta; F. Cuesta-Gómez;
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Grupo Arqueometal/Laboratorio de Microscopía Electrónica y Microanálisis (MicroLab). Centro de Ciencias Humanas y Sociales CSIC. Albasanz 26-28 28037 Madrid Spain alicia.perea@cchs.csic.es;

Fundación Museos Banco Central de Costa Rica;

Museo Arqueológico Nacional Madrid;

Instituto de Física UNAM Mexico;

Museo de América Madrid;

Grupo Arqueometal/Laboratorio de Microscopía Electrónica y Microanálisis (MicroLab). Centro de Ciencias Humanas y Sociales CSIC. Albasanz 26-28 28037 Madrid Spain;

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Combining SEM-EDS, PIXE and XRF Techniques for Complex Analytical Problems: Depth Profile Characterization of Prehispanic Gold

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