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MTF Comparisons Between Mesa and Planar Focal Plane Detector Structures

机译:台面和平面焦平面探测器结构之间的MTF比较

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Raytheon Vision Systems (RVS) has developed scanning, high-speed (>3klps), all digital, with on-chip Analog-to-Digital Conversion (ADC), mid-wave infrared (MWIR 3-5μm) focal plane arrays (FPA) with excellent modulation transfer function (MTF) performance. Using secondary ion mass spectrometry (SIMS) data and detailed models of the mesa geometry, RVS modeled the predicted detector MTF performance of detectors. These detectors have a mesa structure and geometry for improved MTF performance compared to planar HgCdTe and InSb detector structures and other similar detector structures such as nBn. Figure 1 compares the modeled data to measured MTF data obtained from edge spread measurements and shows excellent agreement. The measured data was obtained using an advanced, Raytheon developed test set with 1 urn precision alignment and automatic data acquisition for report generation in less than five minutes per FPA. The measured MTF values of 83 unique parts, Figure 2, had a standard deviation of 0.0094 and a mean absolute deviation of 0.0066 at Nyquist frequency (0.5 cycles per pixel), showing excellent process repeatability and a design that supports high MTF with good repeatability.
机译:雷神视觉系统(RVS)开发了全数字扫描,高速(> 3klps),片上模数转换(ADC),中波红外(MWIR3-5μm)焦平面阵列(FPA) )具有出色的调制传递函数(MTF)性能。使用二次离子质谱(SIMS)数据和台面几何形状的详细模型,RVS为检测器的预测检测器MTF性能建模。与平面HgCdTe和InSb检测器结构以及其他类似检测器结构(例如nBn)相比,这些检测器具有台面结构和几何形状,可提高MTF性能。图1将建模数据与通过边缘扩展测量获得的MTF数据进行了比较,显示出极好的一致性。测量数据是使用先进的,由雷神公司开发的测试装置获得的,该测试装置具有1缸精度校准和自动数据采集功能,每FPA不到五分钟即可生成报告。图2中83个独特零件的测量MTF值在奈奎斯特频率(每个像素0.5个循环)下的标准偏差为0.0094,平均绝对偏差为0.0066,显示出极好的工艺可重复性,并且该设计支持具有良好可重复性的高MTF。

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