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Early-onset Degradation of Thin-film Magnet Wire Insulation for Electromechanical Energy Converters

机译:机电换能器的薄膜电磁线绝缘的过早降解

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One of the predominant fault modes of electric machines is insulation failure which may lead to short circuits and catastrophic failure. Electrical insulation materials provide the vital function of turn-to-turn, phase to phase, and phase-to-ground electrical isolation for the electromagnetic coils and circuits. This paper investigates the characterisation of early-onset degradation of thin-film magnet wire insulation at elevated temperatures from 200 to 275 °C. Sample specimens were analysed after ageing for 100 hours in terms of their physical properties (surface roughness, mass), chemical properties (Fourier Transform Infra-Red (FTIR) spectroscopy), dielectric properties (capacitance, dissipation factor and impedance) and electrical properties (voltage breakdown strength and resistance). The roughness and mass increase and decrease fairly uniformly, respectively, as might be expected, with increased ageing temperature. The dielectric and electrical properties, however, do not change uniformly with ageing temperature and the results here appear not to conform to the commonly accepted Arrhenius law for insulation lifetime versus temperature. Instead we find that for slightly elevated temperatures (200 and 215
机译:电机的主要故障模式之一是绝缘故障,它可能导致短路和灾难性故障。电绝缘材料为电磁线圈和电路提供了匝间,相间和相间电隔离的重要功能。本文研究了在200至275°C的高温下薄膜电磁线绝缘的较早发作退化的特征。样品老化100小时后,根据其物理性质(表面粗糙度,质量),化学性质(傅立叶变换红外(FTIR)光谱),介电性质(电容,耗散因数和阻抗)和电性质(击穿强度和电阻)。可以预期,随着时效温度的升高,粗糙度和质量分别相当均匀地增加和减少。然而,介电和电性能不会随老化温度而均匀变化,此处的结果似乎不符合公认的绝缘寿命随温度变化的阿伦尼乌斯定律。相反,我们发现对于稍微升高的温度(200和215

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