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A Multiphysics Coupled Electro-thermo-mechanical Model of Whisker Shorting

机译:晶须短路的多物理场电热机械耦合模型

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This work considers the behavior of a metallic whisker as it is causing a short circuit. This is achieved by using a coupled electro-thermo-mechanical numerical model (i.e. multiphysics finite elements). The shorted current passing through the whisker will cause it to heat and the temperature to rise. The temperature rise can cause the whisker to soften and stresses to grow. Eventually this could cause the whisker to melt or fail, which in turn breaks the short circuit. This work examines at what conditions this will occur for typical whiskers consisting of tin. The model is able to include temperature dependent properties such as resistivity and strength, which is difficult to accomplish in closed-form analysis. Based on the finite element model and existing theory, equations are also provided to make predictions of the maximum current that can be withstood by a typical whisker before its demise.
机译:这项工作考虑了金属晶须引起短路的行为。这是通过使用耦合的电热机械数值模型(即多物理场有限元)来实现的。流经晶须的短路电流将导致其发热,温度升高。温度升高会导致晶须软化并增加应力。最终,这可能会导致晶须熔化或失效,从而中断短路。这项工作研究了典型的锡晶须在什么条件下会发生。该模型能够包含与温度相关的特性,例如电阻率和强度,这在闭合形式分析中很难实现。基于有限元模型和现有理论,还提供了方程式来预测典型晶须消亡之前可以承受的最大电流。

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