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Impact of Surface Morphology on Arcing Induced Erosion of CuW Contacts in Gas Circuit Breakers

机译:表面形态对气体断路器中CuW触头的电弧诱导腐蚀的影响

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In this paper, the impact of surface morphology of contacts, in particular different microstructural parameters like size and distribution of contact ingredients, on contact erosion in high voltage gas circuit breaker is investigated. It is demonstrated that the size and contiguity of copper and tungsten zones play a key role in contact erosion so that the mass loss in one specific contact after interruption of the rated short-circuit current is 2.5 times higher than that of another one, with the same dimensions and material composition. It is shown that the arc roots tend to be formed on larger copper zones and if the zones are not confined by tungsten area, the arc cross section expands resulting in a higher evaporation rate of copper areas. In addition, it is emphasized that ejection of tungsten particles after evaporation of surrounding copper areas is another mechanism leading to more contact erosion, which has to be taken into consideration in contact erosion modeling along with molten contact splash and vaporization.
机译:在本文中,研究了触头的表面形态,特别是不同的微观结构参数(如触头成分的大小和分布)对高压气体断路器触头腐蚀的影响。结果表明,铜和钨区域的大小和连续性在接触腐蚀中起着关键作用,因此,在断开额定短路电流后,一个特定接触的质量损失是另一接触的质量损失的2.5倍。相同的尺寸和材料组成。结果表明,电弧根趋于在较大的铜区域上形成,如果这些区域不被钨的面积所限制,则电弧的横截面会扩大,从而导致铜区域的蒸发率更高。另外,要强调的是,在周围的铜区域蒸发之后,钨微粒的喷出是导致更多接触腐蚀的另一种机制,在接触腐蚀建模以及熔融接触飞溅和汽化过程中必须考虑到这一点。

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