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Ab initio analysis on stability of metal atoms in β-Si_3N_4/Si structure

机译:从头算分析β-Si_3N_4/ Si结构中金属原子的稳定性

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We have analyzed the metal behavior in the SiN/Si structure with density functional theory. The structure of SiN film was assumed to be a β-Si_3N_4 single crystal. We separated the SiN/Si structure into three models: first, β-Si_3N_4 bulk model for inside the SiN thin film; second, interface model of β-Si_3N_4Si, and third, Si bulk model for Si substrate. Furthermore, Cr, Fe, Ni, Cu or W atom was placed in each model and the geometry optimization was performed to evaluate the formation energy. The order of the calculated formation energy of each metal in β-Si_3N_4/Si structure is W > Cr, Fe > Cu, Ni. By using the calculated values of formation energy of these metals, we explained the experimental results to some extent.
机译:我们已经使用密度泛函理论分析了SiN / Si结构中的金属行为。假设SiN膜的结构是β-Si_3N_4单晶。我们将SiN / Si结构分为三个模型:首先,用于SiN薄膜内部的β-Si_3N_4块模型。第二,β-Si_3N_4Si的界面模型,第三,用于Si衬底的Si体模型。此外,在每个模型中都放置了Cr,Fe,Ni,Cu或W原子,并进行了几何优化以评估形成能。 β-Si_3N_4/ Si结构中每种金属的形成能的计算顺序为W> Cr,Fe> Cu,Ni。通过使用这些金属的形成能的计算值,我们在一定程度上解释了实验结果。

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    Department of Communication Engineering, Okayama Prefectural University, 111 Kuboki, Soja, Okayama 719-1197, Japan;

    Department of Communication Engineering, Okayama Prefectural University, 111 Kuboki, Soja, Okayama 719-1197, Japan;

    Department of Communication Engineering, Okayama Prefectural University, 111 Kuboki, Soja, Okayama 719-1197, Japan;

    Sony Corporation, 4-14-1, Asahi-cho, Atsugi 243-0014, Japan;

    Sony Corporation, 4-14-1, Asahi-cho, Atsugi 243-0014, Japan;

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