Embedded real-time classifier for profiling sensors and custom detector configuration

摘要

A profiling sensor has been realized using a vertical column of sparse detectors with the sensor's optical axis configured perpendicular to the plane of the vertical column of detectors. Traditionally, detectors of the profiling sensor are placed in a sparse vertical column configuration. A subset of the detectors may be removed from the vertical column and placed at arbitrary locations along the anticipated path of the objects of interest, forming a custom detector array configuration. Objects passing through the profiling sensor's field of view have traditionally been classified via algorithms processed off-line. However, reconstruction of the object profile is impossible unless the detectors are placed at a known location relative to each other. Measuring these detector locations relative to each other can be particularly time consuming, making this process impractical for custom detector configuration in the field. This paper describes a method that can be used to determine a detector's relative location to other detectors by passing a known profile through the sensor's field of view as part of the configuration process. Real-time classification results produced by the embedded controller for a variety of objects of interest are also described in the paper