INFLUENCE OF DVM'S INPUT PARAMETERS ON DVM-BASED HIGH-OHM RESISTANCE COMPARISON

摘要

Establishment and maintenance of resistance rnstandard traceability is one of the main tasks of Primary rnElectromagnetic Laboratory (PEL) within the Faculty of rnElectrical Engineering and Computing of the University of rnZagreb. For the purpose of accurate resistance standards rncomparison a digital voltmeter (DVM) based method has rnbeen designed and realized. When measuring resistance rnstandards greater than 10 MΩ capabilities of the method are rnrestricted due to influence of DVM's input parameters: input rnDVM's resistance, input offset current and input rncapacitance. Determination of DVM's input parameters and rntheir contribution to the overall high-ohm resistance rncomparison uncertainty has been presented in this paper. rnThe possibility of use of DVM-based method for gigaohm rnvalue resistors comparison has also been investigated.