Gate-to-Cathode capacitor impact on Triac immunity and reliability

摘要

Designers are used to adding a capacitor between the control terminal and the drive reference terminal to increase immunity of power semiconductor devices to fast transient voltages. Even if this solution is good for most devices, such a design trick has to be avoided with Triacs. Indeed a gate-to-cathode capacitor significantly decreases the Triac robustness to dI/dt and overvoltages.