首页> 外文会议>Conference on Interferometry XII: Techniques and Analysis; 20040802-20040803; Denver,CO; US >Statistical property of the complex analytic signal of white-light speckle pattern applied to micro-displacement measurement
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Statistical property of the complex analytic signal of white-light speckle pattern applied to micro-displacement measurement

机译:白光散斑图样的复杂分析信号在微位移测量中的统计性质

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摘要

Under the assumption of Gaussian random process, we discuss the first and the second order statistical properties of the complex amplitude of analytic signal of the white-light speckle pattern. We derive the autocorrelation function of the pseudo phase. Based on these results, we show mathematically that the proposed signal domain phase-only correlation (SD-POC) has advantage over the conventional intensity-based correlation techniques in its performance of micro-displacement measurement. We also present experimental results that support the theory.
机译:在高斯随机过程的假设下,我们讨论了白光散斑图案的解析信号的复振幅的一阶和二阶统计性质。我们导出伪相位的自相关函数。基于这些结果,我们在数学上表明,提出的信号域仅相位相关(SD-POC)在微位移测量性能方面优于传统的基于强度的相关技术。我们还提出了支持该理论的实验结果。

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