首页> 外文会议>Conference on Helmet- and Head-Mounted Displays Ⅶ Apr 1-2, 2002 Orlando, USA >Comparison of n x n grille CTF measurement for VESA standard and large sample aperture methods
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Comparison of n x n grille CTF measurement for VESA standard and large sample aperture methods

机译:VESA标准和大样品孔径方法的n x n格栅CTF测量的比较

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摘要

An alternative method for measuring the contrast transfer function (CTF) of a pixilated display is proposed that reduces the amount of time required to perform a high sample rate-small aperture luminance scan as outlined in the Video Electronics Standards Association (VESA) standard for measuring the contrast of an n X n grille. The alternative method proposed by the Night Vision Electronic Sensors Directorate (NVESD) Displays group utilizes round sampling apertures and large step sizes to achieve comparable results to the VESA standard method. Theoretical predictions and experimental measurements demonstrated the equivalency between the proposed large aperture method and the VESA standard method with less than 8% maximum variation and an average of 2.4% variation between the two methods over two different input contrasts and 4 different grille frequencies. Experimental results also show a reduction in time to perform the profile scan by as much as 15:1 for the NVESD proposed test method over the VESA standard method.
机译:提出了一种测量像素化显示器的对比度传递函数(CTF)的替代方法,该方法可减少执行高采样率,小孔径亮度扫描所需的时间,如视频电子标准协会(VESA)标准中所述。 n X n格栅的对比度。夜视电子传感器理事会(NVESD)显示器小组提出的另一种方法是利用圆形采样孔和大步长来获得与VESA标准方法相当的结果。理论预测和实验测量表明,在两种不同的输入对比度和4种不同的格栅频率下,所提出的大光圈方法与VESA标准方法之间的等效性具有小于8%的最大偏差,并且两种方法之间的平均偏差为2.4%。实验结果还显示,与VESA标准方法相比,NVESD建议的测试方法执行配置文件扫描的时间减少了15:1。

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