首页> 外文会议>Asian International Workshop on Advanced Reliability Modeling(AIWARM 2004); 20040826-27; Hiroshima(JP) >A SEQUENTIAL DESIGN FOR BINARY LIFETIME TESTING ON WEIBULL DISTRIBUTION WITH UNKNOWN SCALE PARAMETER
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A SEQUENTIAL DESIGN FOR BINARY LIFETIME TESTING ON WEIBULL DISTRIBUTION WITH UNKNOWN SCALE PARAMETER

机译:具有未知尺度参数的威布尔分布二进制寿命测试的序列设计

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摘要

We develop an sequential experimental plan for items which needs destructive lifetime testings. This plan repeats estimating unknown parameters by MLE and trying to set the observation time so as to gain the precision of the final estimates. We conduct a simulation study to compare our procedure with a plan in the literature and find certain advantages against it.
机译:我们为需要破坏性寿命测试的项目制定了顺序实验计划。该计划通过MLE重复估计未知参数,并尝试设置观察时间,以获得最终估计的精度。我们进行了仿真研究,以将我们的程序与文献中的计划进行比较,并找到了与之相对的优势。

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