首页> 外文会议>Asia-Pacific Microwave Conference vol.4; 20051204-07; Suzhou(CN) >Nondestructive and Simultaneous Measurement of Complex EM Parameters with Scalar Reflectometer
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Nondestructive and Simultaneous Measurement of Complex EM Parameters with Scalar Reflectometer

机译:用标量反射仪无损同时测量复杂的电磁参数

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摘要

A scalar reflectometer based, low cost method, named "multi-thickness method"(MTM), is proposed for non destructively and simultaneously characterizing the complex permittivity and permeability of high loss materials via an open-ended coaxial probe. The measurement system is established, while the sample-loaded open-ended coaxial probe is modeled by the spectral domain immitance(SDI) method. A discussion about how to select the multi thicknesses of test sample is also included based on the analysis and our experiences. The broadband frequency-swept measurement has been conducted on a typical absorbing material under different thicknesses combination conditions. The experiment results agree well with the reference data, which validates the feasibility and effectiveness of this improved technique.
机译:提出了一种基于标量反射仪的低成本方法,称为“多厚度方法”(MTM),该方法可无损地通过开放式同轴探针同时表征高损耗材料的复介电常数和磁导率。建立了测量系统,并通过光谱域阻抗法对样品加载的开放式同轴探针进行了建模。根据分析和我们的经验,还讨论了如何选择多种厚度的测试样品。宽带扫频测量是在不同厚度组合条件下对典型的吸收材料进行的。实验结果与参考数据吻合良好,验证了该改进技术的可行性和有效性。

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