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Experimental characterization of electromagnetic cloaking structures with bistatic measurements at X-band

机译:X波段双基地​​测量电磁隐身结构的实验表征

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Bistatic measurements within the X-band frequency range are carried out to fully characterize the reduction of the total scattering widths of selected metal objects. This reduction is obtained by the use of two distinct cloaking structures. The measurements demonstrate that the total scattering widths of these metallic objects can be dramatically reduced with the studied cloaking structures. In addition, the isotropy of the realized cloaks is studied experimentally by analyzing the dependence of the scattering intensity on the angle of incidence of the illuminating wave.
机译:在X波段频率范围内进行双基地测量,以充分表征所选金属物体总散射宽度的减小。这种减少是通过使用两个不同的隐身结构来实现的。测量结果表明,通过研究隐身结构,可以大大减小这些金属物体的总散射宽度。此外,通过分析散射强度对照明波入射角的依赖性,对已实现的隐身衣的各向同性进行了实验研究。

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