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BROADBAND DUAL POLARIZED MATERIAL TEST SYSTEM

机译:宽带双极化材料测试系统

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The S parameter measurement of large sheet materials has been limited to microwave frequencies due to a lack of test apparatus that could properly illuminate the materials with a uniform electromagnetic wave in a confined space at lower frequencies. Boeing Mesa has developed a unique test system that overcomes this limitation. The current design will perform S_(11) and S_(12) measurements from 0.125 to 40 GHz in five bands. Sample sizes up to 4 ft. wide, 8+ ft. long, and 12 inches thick, can be tested in sections by sliding the sample into the test fixture. Apertures up to 46 inches square can be provided in the aperture plate. The angle of incidence can be adjusted from 0 degrees to 45 degrees. Key words: Absorbing materials; Material measurement systems; RAM; S- parameters.
机译:大尺寸板材的S参数测量由于缺乏能够在较低频率的密闭空间中用均匀的电磁波正确照射材料的测试设备而被限制在微波频率下。波音Mesa开发了一种独特的测试系统,可以克服此限制。当前设计将在五个频带中执行0.125至40 GHz的S_(11)和S_(12)测量。通过将样品滑入测试夹具,可以分批测试最大4英尺宽,8英尺以上长和12英寸厚的样品大小。孔板上可提供最大46平方英寸的孔。入射角可以在0度到45度之间调节。关键字:吸收材料;材料测量系统;内存; S-参数。

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