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Adhesion of DNA Nanostructures and DNA Origami to lithographically patterned self-assembled monolayers on Si100

机译:DNA纳米结构和DNA折纸对Si上光刻图案化的自组装单层的粘附100

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Cationic self-assembled monolayers (SAMs) can easily be formed on silicon dioxide via siloxane chemistry, and these SAMs provide robustly attached surface charges that anchor DNA nanostructures and origami. The surface charge of the SAM can be controlled by formation of mixed monolayers of aminopropyltriethoxysilane (APTES) and trimethyl aminopropyltrimethoxysilyl chloride (TMAC). X-ray photoelectron spectra of mixed monolayers show surface charges ranging from about 1 to 3 charges per nm~2. At high mole fractions of APTES, binding defects such as folded and rolled origami are common; at moderate mole fractions of APTES, binding metrics for DNA origami are comparable to mica, and on pure TMAC, binding is weaker than on mica. In order to locate individual DNA nanostructures at desired sites, 35-40 nm APTES dots or 125 nm APTES stripes were fabricated by a combination of EBL and molecular liftoff. Deposition of small DNA nanostructures (8 nm×37 nm ×2 nm) or DNA origami (60 nm×90 nm) was conducted in 0.1.1.0 micromolar solution. The binding selectivity between the anchor pads and the background silicon dioxide was at least 50:1. The DNA origami are persistently attached and can be imaged in air after rinsing the substrate in flowing water.
机译:阳离子自组装单分子层(SAMs)可以通过硅氧烷化学反应轻松在二氧化硅上形成,这些SAMs提供牢固附着的表面电荷,可锚定DNA纳米结构和折纸。 SAM的表面电荷可通过形成氨基丙基三乙氧基硅烷(APTES)和三甲基氨基丙基三甲氧基甲硅烷基氯(TMAC)的混合单层来控制。混合单分子层的X射线光电子能谱显示的表面电荷范围为每nm〜2约1至3个电荷。在APTES的摩尔分数较高时,结合缺陷(如折叠和卷起的折纸)很常见;在适中的APTES摩尔分数下,DNA折纸的结合指标可与云母媲美,而在纯TMAC上,结合力则比在云母上弱。为了将各个DNA纳米结构定位在所需位点,通过结合EBL和分子剥离技术制备了35-40 nm APTES点或125 nm APTES条带。在0.1.1.0微摩尔溶液中进行小DNA纳米结构(8 nm×37 nm×2 nm)或DNA折纸(60 nm×90 nm)的沉积。锚定垫和背景二氧化硅之间的结合选择性为至少50:1。 DNA折纸永久附着,在流动水中冲洗底物后可在空气中成像。

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