Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines

摘要

New physical-vapor-deposited (PVD) beryllium foils were characterized using coherent x-rays at the 1-km-long beamline in the SPring-8. Non-uniformity in the 150 umxl50 urn area is 3% (rms) for 0.1-nm x-rays and 5% for 0.15-nm x-rays which are almost similar value to that of previous PVD foils. The PVD beryllium foil has a capability for synchrotron radiation and x-ray free electron laser applications with spatially coherent x-rays.