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CMOS solid state photomultipliers for ultra-low light levels

机译:CMOS固态光电倍增管,可实现超低亮度

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Detection of single photons is crucial for a number of applications. Geiger photodiodes (GPD) provide large gains with an insignificant amount of multiplication noise exclusively from the diode. When the GPD is operated above the reverse bias breakdown voltage, the diode can avalanche due to charged pairs generated from random noise (typically thermal) or incident photons. The GPD is a binary device, as only one photon is needed to trigger an avalanche, regardless of the number of incident photons. A solid-state photomultiplier (SSPM) is an array of GPDs, and the output of the SSPM is proportional to the incident light intensity, providing a replacement for photomultiplier tubes. We have developed CMOS SSPMs using a commercial fabrication process for a myriad of applications. We present results on the operation of these devices for low intensity light pulses. The data analysis provides a measured of the junction capacitance (~150 fF), which affects the rise time (~2 ns), the fall time (~32 ns), and gain (>106). Multipliers for the cross talk and after pulsing are given, and a consistent picture within the theory of operation of the expected dark current and photodetection efficiency is demonstrate. Enhancement of the detection efficiency with respect to the quantum efficiency at unity gain for shallow UV photons is measured, indicating an effect due to fringe fields within the diode structure. The signal and noise terms have been deconvolved from each other, providing the fundamental model for characterizing the behavior at low-light intensities
机译:单光子的检测对于许多应用至关重要。盖革光电二极管(GPD)提供大的增益,而来自二极管的乘法噪声却微不足道。当GPD在反向偏置击穿电压以上工作时,二极管会由于随机噪声(通常是热噪声)或入射光子产生的带电对而发生雪崩。 GPD是一种二进制设备,因为与入射光子的数量无关,只需一个光子即可触发雪崩。固态光电倍增管(SSPM)是GPD的阵列,SSPM的输出与入射光强度成正比,可替代光电倍增管。我们已经使用商业制造工艺开发了CMOS SSPM,用于多种应用。我们介绍了这些设备在低强度光脉冲下的运行结果。数据分析提供了结电容(〜150 fF)的测量值,这会影响上升时间(〜2 ns),下降时间(〜32 ns)和增益(> 106)。给出了串扰和脉冲后的乘数,并证明了预期的暗电流和光电检测效率的工作原理内的一致性。相对于浅紫外光子在单位增益下的量子效率而言,检测效率的增强得以测量,这表明由于二极管结构内的边缘场而产生的影响。信号项和噪声项已相互反卷积,提供了用于表征低光照强度下的行为的基本模型

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