首页> 外文会议>6th International Symposium on Molten Salt Chemistry and Technology; Oct, 2001; Shanghai, China >Electrodeposition of Compound Semiconductor Film, ZnTe, in Molten Chloride
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Electrodeposition of Compound Semiconductor Film, ZnTe, in Molten Chloride

机译:在熔融氯化物中电沉积ZnTe化合物半导体膜

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摘要

Electrochemical behaviors of Zn and Te were investigated in eutectic ZnCl_2-KCl (54.1-45.9 mol%) including TeCl_4. The underpotential deposition, UPD, of Zn was observed in this system. The co-electrodeposition of Zn and Te gave rise to form the Zn-Te alloy on W or Ni substrate. The deposits were formed as particles, not a thin film on the W substrate. The size of the deposit gradually grew up with increasing electrolysis temperature. On the other hand, a Ni-Te alloy film was mainly obtained on the Ni substrate, other than Zn-Te alloy at 673 K. Increasing temperature up to 708 K above the melting point of Zn tended to prevent the formation of the Ni-Te alloy, and accelerate the formation of the Zn-Te alloy.
机译:在包括TeCl_4的共晶ZnCl_2-KCl(54.1-45.9 mol%)中研究了Zn和Te的电化学行为。在该系统中观察到了锌的欠电位沉积,UPD。 Zn和Te的共电沉积在W或Ni衬底上形成了Zn-Te合金。沉积物形成为颗粒,而不是W衬底上的薄膜。随着电解温度的升高,沉积物的尺寸逐渐增大。另一方面,除了Zn-Te合金外,主要在Ni基体上以673 K获得Ni-Te合金膜。将温度升高到Zn熔点以上708 K倾向于防止Ni-Te膜的形成。 Te合金,并加速Zn-Te合金的形成。

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