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Fine-Grained Design Pattern Detection

机译:细粒度设计模式检测

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摘要

Design patterns have been used successfully to build well-organized, flexible software systems. In the reverse engineering field, detecting design patterns can simplify program comprehension by providing clues about the rationale behind the system's design. However, the precision and recall of existing approaches to design pattern detection leave room for improvement. In this paper, we introduce a novel technique called FiG that complements existing detection methods by utilizing fine-grained static information contained in the software system. Our approach filters a large number of false positives by utilizing fine-grained rules that describe the static structure of a design pattern. We have implemented our approach in the context of the Eiffel programming language. Several experiments were performed to determine the effectiveness of the proposed approach.
机译:设计模式已成功用于构建组织良好,灵活的软件系统。在逆向工程领域,通过提供有关系统设计背后原理的线索,检测设计模式可以简化程序理解。但是,现有的设计模式检测方法的精度和召回率还有待改进。在本文中,我们介绍了一种称为FiG的新技术,该技术通过利用软件系统中包含的细粒度静态信息来补充现有的检测方法。我们的方法通过利用描述设计模式的静态结构的细粒度规则来过滤大量误报。我们已经在Eiffel编程语言的上下文中实现了我们的方法。进行了几次实验,以确定该方法的有效性。

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