NANOSTRUCTURE FORMATION OF COPPER CLUSTERS USING CONTACT MODE AFM: DEPENDENCE ON CLUSTER ADHESION

摘要

We have shown that the ease of Cu cluster movement on a Cyclotene surface by C-AFM depends on the adhesion of the cluster to the surface. Thus, the height of a line formed by clusters displaced by an AFM tip, under a given set of conditions, may be used to evaluate the adhesion of thin Cu films. This is a second demonstration of our recent finding of a relationship between nanoscopic and macroscopic measures of adhesion.