首页> 外文会议>22nd Capacitor and Resistor Technology Symposium (CARTS 2002) Mar 26-28, 2002 New Orleans, Louisiana >Environmentally Induced Failure Mechanisms For Surface Mount Tantalum Capacitors
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Environmentally Induced Failure Mechanisms For Surface Mount Tantalum Capacitors

机译:表面安装钽电容器的环境诱发故障机制

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摘要

Surface mounted solid tantalum capacitors can be incredibly reliable components when properly screened and applied. However, for continued reliability during insertion into hardware and beyond, the capacitor also has to be adequately environmentally sealed to prevent poisoning of the various internal interfaces. Two failure mechanisms that can occur when external contamination breaches the device will be described along with tests to diagnose these conditions.
机译:如果正确筛选和使用表面安装的固态钽电容器,它们将是令人难以置信的可靠组件。但是,为了在插入硬件及其他过程中保持持续的可靠性,还必须对电容器进行充分的环境密封,以防止各种内部接口中毒。将描述当外部污染破坏设备时可能发生的两种故障机制,以及诊断这些情况的测试。

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