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Study of ferroelectric SBN thin films for electro-optic applications

机译:用于电光应用的SBN铁电薄膜的研究

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摘要

The Ferroelectric strontium barium niobate (SBN) thin films are prepared using Pulsed Laser Deposition (PLD) technique. XRD spectra of the prepared films indicate the polycrystalline growth confirming the formation of tetragonal tungsten bronze structure. A waveguide is fabricated so as to guide the light in SBN thin film. The EO measurements for the SBN thin films have been carried out using Senarmont Compensation method in order to examine the dynamic variation of EO coefficient of the prepared films. The value of dynamic EO coefficient is found to be 198pm/V.
机译:使用脉冲激光沉积(PLD)技术制备铁电铌酸钡钡(SBN)薄膜。制备的膜的XRD光谱表明多晶生长,证实了四方钨青铜结构的形成。制造波导以引导SBN薄膜中的光。为了检查所制备薄膜的EO系数的动态变化,已经使用Senarmont补偿方法对SBN薄膜进行了EO测量。发现动态EO系数的值为198pm / V。

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