Study on a new sub-wavelength grating for antireflective structure of solar cell

摘要

A new sub-wavelength grating for Anti-Reflective (AR) coating layer of solar cells is proposed in this paper. The reflectivity of this structure is investigated by the Rigorous Coupled Wave Analysis (RCWA) method. Numerical results show that compared with general SiO2 AR coating layer, the average reflectivity of this new structure has greatly been reduced by 16% and 10.85% under TE and TM modes respectively. And the average reflection rate is less than 6% when the incident wave is working in a range of the wavelength between 400 nm and 1400nm. Good performance of the new structure makes it possible to develop practical applications.