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Lump devices mapping between designer's schematic and layout extracted schematic in microwave frequency

机译:微波频率下设计人员的原理图和布局提取的原理图之间的块状设备映射

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This paper presents an algorithm that can compare the net-lists between schematic and layout of passive microwave multi-layer circuits. Weight vectors that are related to inductance and capacitance of devices connected to a node are defined for node mapping. However, due to the symmetry of microwave circuits, many possible mapping may be found. We then developed a scoring policy to find the most similar mapping. This checker can help designers to verify layout by comparing the net-list from designer's schematic and net-list extracted from layout. This algorithm can also provide missing and extra devices in net-list to assist designer to allocate layout errors quickly.
机译:本文提出了一种可以比较无源微波多层电路原理图和布局之间的网表的算法。定义与节点连接的设备的电感和电容有关的权重向量以进行节点映射。但是,由于微波电路的对称性,可能会发现许多可能的映射。然后,我们制定了评分策略以查找最相似的映射。该检查器可以通过比较设计师原理图的网表和从布局中提取的网表来帮助设计师验证布局。该算法还可以在网表中提供丢失和多余的设备,以帮助设计人员快速分配布局错误。

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