首页> 外文会议>Nano Science and Technology Institute(NSTI) Nanotechnology Conference and Trade Show(NSTI Nanotech 2006) vol.3 >Comparison of Roughness Measurements between a Contact Stylus Instrument and an Optical Measurement Device based on a Colour Focus Sensor
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Comparison of Roughness Measurements between a Contact Stylus Instrument and an Optical Measurement Device based on a Colour Focus Sensor

机译:基于彩色聚焦传感器的接触式测针仪与光学测量仪的粗糙度测量比较

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摘要

The measurement of the roughness of technical surfaces plays an important role in scientific and industrial applications. Traditionally the roughness has been measured using contact stylus instruments. In contrast to this, we present the optical measurement device InfiniteFocus by Alicona Imaging, which is able to reconstruct 3D models of technical surfaces and allows amongst others to measure their roughness. We demonstrate this using a random micro-roughness standard with known calibrated roughness parameters Ra and Rz.
机译:技术表面粗糙度的测量在科学和工业应用中起着重要的作用。传统上,粗糙度是使用接触式测针仪测量的。与此相反,我们介绍了由Alicona Imaging提供的光学测量设备InfiniteFocus,它能够重建技术表面的3D模型并允许测量其粗糙度。我们使用具有已知的校准粗糙度参数Ra和Rz的随机微粗糙度标准件对此进行了演示。

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