High Resolution Compton Imaging of Nanostructures

摘要

A novel and unique imaging technique is described. It is based on Compton scattering, a fundamentally different physical process than those based on photo-absorption techniques (such as XPS and its variants UPS/SRPS). This is unique since it yields information on electron cloud distribution of molecules on the interface at subnano resolution ― a fraction of an angstrom or better. This resolution is unmatched by conventional imaging techniques available today, potentially enabling the study of interface structure of nanocomposite materials with unprecedented detail.